Kontakt: Dr. Cheng Yang (Senior Engineer)

Near-field scanning (NFS) is an important technique in evaluating the radiation and emission of electromagnetic (EM) fields originating from microwave devices and components. Over the past decades, considerable progresses have been made in enhancing scanning capabilities, including the usage of robotics, high-speed instrument communication, and high-sampling rate equipment. Despite these advancements, the time and cost of measurements are still limited by requests for large-scale, high-resolution, magnitude, and phase scanning, particularly in integrated-circuit (IC) and antenna applications concerning electromagnetic compatibility (EMC) tests.

This project aims to significantly reduce the time and cost of traditional Near-Field Scanning (NFS) by tenfold without compromising accuracy. This will be accomplished through the utilization of an innovative single-probe on-the-fly (OTF) data acquisition and processing technique. As a proof of concept, a coil antenna example has undergone testing, as depicted in (a) and (b). The technique will be extended for cost-effective indoor and outdoor EMC testing up to GHz frequencies.